Texas Instruments reliability scientist Robert Baumann stated that, "Soft errors induced the highest failure rate of all other reliability mechanisms combined."
What the chain says
- Block
- 639 282
- Time
- 2020-06-14T05:43:23Z
- Signer
- 17hwsWwRfKtyJZFcJZxg8ampDsL4dVD12i
- App
- twetch
- Type
- post
- Content type
- text/plain
- Name in tx
- twetch#2331
Fields the transaction did not carry are omitted. Open the payload to see the bytes as stored.
Signed by
17hwsWwRfKtyJZFcJZxg8ampDsL4dVD12i Verified